14th International Metrology Congress in Paris, June 2009
The 14th International Metrology Congress will be held in Paris (Palais des Congrès, Porte Maillot) from 22 to 25 June 2009.
The aim of the Congress is to :
- assess developments in metrology and their implications for industry, R&D and society
- promote measurement as a tool for quality within companies
- contribute to improving measurement processes
- review progress in innovative technologies
The congress will feature presentations of papers, sessions where participants can discuss specific topics with specialists, and six round tables.
The following themes will be covered :
- control of measurement, analysis and test processes
- physical and chemical quantities
- regulations and their scope
- legal metrology and international recognition
- new metrology and new sectors.
Proposals are now invited for conference papers. A form is provided on the Congress website.
New feature : An award will be presented for the best conference paper.For further information,
Tel.: 33 (0)4 67 06 20 36
E-mail: info@cfmetrologie.com
