Find hereafter events the LNE is involved in : exhibitions, conferences...
SPIE Photonics Europe
The Conference on photonics, optics, lasers, and micro/nanotechnologies will gather the scientific community.
Benoît Poyet will present the work of the researchers of the "Atomic Force Microscope Dimensional Measurement: AFM Metrology" project in a conference to be held on Thursday 15 April at 8:40 am and entitled:
3rd International Metrology Conference CAFMET 2010
This Conference is hosted by the African Committee of Metrology (CAFMET). The LNE will do three speeches:
Symposium within the frame of Euramet’s 4th general meeting
In addition to its 4th general meeting, Euramet will hold a symposium with the representatives from European laboratories. This symposium will offer an overview on the joint research projects (JRP) in progress that are led within the frame of the iMERA+ program. As a coordinator, François Piquemal, who is in charge of the research on fundamental electrical metrology, will give a lecture on “electricity and magnetism”.
[Euramet general meeting and symposium]
EUSPEN 2010 - International Conference of the European Society for Precision Engineering and Nanotechnology
This year, EUSPEN 2010 International Conference will be held from Monday 31 May to Friday 4 June at Delft in the Netherlands.
The 10th International euspen Conference will be focused on the latest advances and market developments in precision processes and manufacturing, as well as fabrication, metrology and cutting-edge materials in the precision, micro and nano engineering sectors.
The work of the researchers of the "Atomic Force Microscope Dimensional Measurement: AFM Metrology" project will be presented in a Conference entitled:
PSAS 2010 - The International Workshop on Precision Physics of Simple Atomic Systems
The conference is devoted to precision studies of simple atomic and molecular systems, in order to see something beyond atomic physics.
François Piquemal, who is in charge of the research on fundamental electrical metrology, will give a lecture on the "Determination of the fundamental electrical constants" on Tuesday 1 June at 10h50
14th européean conference on composite materials
LNE will present a poster on its research in the field of materials mechatronic which is entitled "Mechatronic PCB FR4 behaviours depending on the test temperature and the sampling directions".
27th Conference on Precision Electromagnetic Measurements - CPEM 2010
CPEM 2010, hosted by the KRISS (Korea Research Institute of Standards and Science), is the 27th edition of these international conferences, which are held every 2 years. It focuses on high accuracy measurement in the field of electromagnetism.
LNE will detail its recent research in the field of quantum electrical metrology, in particular the characterization of graphene for implementation of the quantum Hall effect, and the Josephson effect in AC. Other current research fields to be presented will include nanometrology (development of an atomic force microscope), high-frequency bolometric mounts, and energy.
NanoScale 2010
This seminar is jointly hosted by EURAMET, the European Association of National Metrology Institutes, the Czech Metrology Institute (CIM), and the German National Metrology Institute (PTB). The Seminar will be held on October, 27-29, 2010.
Medica 2010
The annual MEDICA trade fair will be taking place in Düsseldorf from 17 to 20 November. Our Paris and Washington teams will be present at stand 17A20B, where they look forward to meeting medical device manufacturers, discussing their quality and certification needs and proposing appropriate solutions for their company and their markets.
Metrology, testing and analysis managers will also be on hand to present LNE's services in a wide range of fields, including active implantable medical devices, orthopaedics, electromedical equipment, hospital equipment and consumables.
If you would like to meet us, please contact us now at info.gmed@lne.fr. We look forward to hearing from you.
